A practical guide to transmission electron microscopy. - download pdf or read online

By Zhiping Luo

ISBN-10: 1606509179

ISBN-13: 9781606509173

ISBN-10: 1606509187

ISBN-13: 9781606509180

Transmission electron microscope (TEM) is an important device for characterizing quite a few different types of fabrics. utilizing a gentle microscope, the imaging solution is at a number of hundred nanometers, and for a scanning electron microscope, SEM, at numerous nanometers. The imaging answer of the TEM, besides the fact that, can frequently achieve a number of angstroms on a modem device. furthermore, the TEM may also supply material Read more...

summary: Transmission electron microscope (TEM) is crucial software for characterizing a variety of kinds of fabrics. utilizing a mild microscope, the imaging solution is at a number of hundred nanometers, and for a scanning electron microscope, SEM, at a number of nanometers. The imaging solution of the TEM, besides the fact that, can normally succeed in numerous angstroms on a modem device. furthermore, the TEM may also supply fabric structural info, because the electrons penetrate in the course of the skinny specimens, and chemical compositional info as a result robust electron-specimen atom interactions. these days, TEM is commonly utilized in varied parts in either actual sciences (chemistry, engineering, geosciences, fabrics technological know-how, and physics) and existence sciences (agriculture, biology, and medicine), enjoying a key position in examine or improvement for fabric layout, synthesis, processing, or functionality. This booklet offers a concise useful consultant to the TEM consumer, ranging from the newbie point, together with upper-division undergraduates, graduates, researchers, and engineers, on tips on how to examine TEM successfully in a brief time period. it really is written basically for fabrics technology and engineering or comparable disciplines, whereas a few purposes in lifestyles sciences also are integrated. It covers many of the parts utilizing TEM, together with the instrumentation, pattern coaching, diffraction, imaging, analytical microscopy, and a few newly constructed complicated microscopy ideas. In each one subject, a theoretical historical past is first of all in brief defined, with step by step directions in experimental operation or computation. a few technical counsel are given with the intention to receive the easiest effects. the sensible methods to obtain, examine, and interpret the TEM info are consequently supplied. This publication may possibly function a textbook for a TEM path or workshop, or a reference e-book for the TEM consumer to enhance their TEM talents

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Additional info for A practical guide to transmission electron microscopy. Volume II, : Advanced microscopy

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Imaging thicker samples. For thick samples, the TEM image becomes blurry since the object cannot be focused because of chromatic aberrations, whereas the chromatic aberration does not affect the STEM imaging contrast. A comparison of STEM images with TEM images is presented in Fig. 3. The sample is a Ni-base superalloy [8], containing cuboidal γ ′ particles enriched in Ni, Al, W, and Ti. Located between γ′ particles is the γ matrix, which is enriched in Cr, Co, and Mo. The width of the γ matrix is about 10−60 nm.

4a) and LaAlO3 (LAO) (Fig. 4b) substrates, respectively, both along the substrate [100]p zone axis (the subscript p stands for perovskite) [9]. Although the films were grown under the same deposition conditions, distinctly different atomic structures are found. An enlarged image at the interface is shown in the 26 A PRACTICAL GUIDE TO TRANSMISSION ELECTRON MICROSCOPY Fig. 3 STEM and TEM images of a Ni-base superalloy containing γ ′ cubes with γ phase between them. (a) STEM at a lower magnification; (b) STEM at a higher magnification from the framed area in (a); (c) TEM image using a small objective aperture showing strong diffraction contrast of dislocations; (d) TEM image using a large objective aperture showing less diffraction contrast; (e) CDF image showing γ ′ phase; (f) WBDF image showing dislocations.

4a) and LaAlO3 (LAO) (Fig. 4b) substrates, respectively, both along the substrate [100]p zone axis (the subscript p stands for perovskite) [9]. Although the films were grown under the same deposition conditions, distinctly different atomic structures are found. An enlarged image at the interface is shown in the 26 A PRACTICAL GUIDE TO TRANSMISSION ELECTRON MICROSCOPY Fig. 3 STEM and TEM images of a Ni-base superalloy containing γ ′ cubes with γ phase between them. (a) STEM at a lower magnification; (b) STEM at a higher magnification from the framed area in (a); (c) TEM image using a small objective aperture showing strong diffraction contrast of dislocations; (d) TEM image using a large objective aperture showing less diffraction contrast; (e) CDF image showing γ ′ phase; (f) WBDF image showing dislocations.

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A practical guide to transmission electron microscopy. Volume II, : Advanced microscopy by Zhiping Luo


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